TSC7034GRev1 Word档.docx

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1、TOYOTAENGINEERINGSTANDARDNO.:TSC7034GTIT1E:TeStmethodfore1ectrica1disturbancesOfPartStobeSUbieCtedtoEMCCertifiCatiOnC1ASS:C1EstabIishediZRevised:Rev.1(Feb.2016)Thisstandardhasbeenrevisedasaresu1tofthefo11owingchanges:(1) additionhasbeenmadetothescope.(Section1)(2) additionhasbeenmadetotheTermsandDef

2、initions.*(Section2(7)(3) theabo1ishedstandardTSC7001Ghasbeenchangedtothenew1yestab1ishedstandardTSC0502G.(Notes(2)to(4)(4) aremarkhasbeenaddedwithregardtothetestequipment.(Section5.1.3)PreparedandWrittenby:E1ectronicPerformanceDeve1opment&EngineeringDept.E1ectronicsContro1SystemDeve1opmentDiv.Desig

3、nQua1ityInnovationDept.TOYOTAMOTORCORPORATIONTeStmethodfore1ectrica1disturbancesOfPartStobeSUbieCtedtoEMCCertifiCatiOn1. ScopeThisstandardcoversthemethodformeasuringthee1ectrica1disturbancesemission1eve1ande1ectrica1disturbancesresistanceofautomotivee1ectronicdeyicesandautomotivee1ectricdevicestobes

4、ubjectedtoEMCcertificationUN-R010accordingtoISO7637-1,ISO7637-2,ISO7637-3andISO16750-2.2. TermsandDefinitionsPrincipa1termsusedinthisstandardsha11bedefinedasfo11ows:(1) E1ectrica1disturbances.Thistermreferstovo1tageorcurrentprimari1yproducedduringthetransientstateofane1ectricore1ectroniccircuit.Atra

5、nsientphenomenonoccurswhenthestab1estateofane1ectronicore1ectriccircuitisdisturbedbyswitchingon/offorshort-circuiting.(2) Automotivee1ectronicdeviceThistermreferstoadeyiceconsistingmain1yofsemiconductorstocontro1asystem.Ita1soreferstoasensor,forcegenerator(actuator),orotherdevicethatisusedincombinat

6、ionwiththesystemcontro1device.(3) Automotivee1ectricdevice.Thistermreferstoadevice,modu1e,orstand-a1onepartconsistingofoneormoreinductione1ements.Automotivee1ectricdevicescreatee1ectrica1disturbanceswhenthecircuitconditionschange.(4) CharacteristicThistermreferstoaspecifica11yspecifiednumerica1va1ue

7、orre1ationofadevicethatcanbequantitative1yorqua1itative1ymeasuredunderapredeterminedcondition.(5) StandardambienceThistermreferstotheambienceofgenera1testsites.Un1essspecifiedspecifica11y,thestandardambienceshaimeanthenorma1temperature(5to35)andnorma1atmosphericpressure(86to106kPa).(6) Deviceunderte

8、st(DUT)Thistermreferstothedevicetobesubjectedtoatest.(7) S1owpu1se/fastpu1sewhenthepu1serepetitiontimeorburstcyc1etimeofthee1ectrica1disturbancestobemeasuredfa11sinthemisor1ongerrange,thepu1sesarereferredtoass1owpu1se.1Whenfa11inginthens.tomsrange,theyarereferredtoas*,fastpu1se.(8) A1ternatorcompose

9、dofZenerdiodeThistermreferstoana1ternatorthecommutatingdiodesofwhichisrep1acedwithaZenerdiodetoreducethecostofanECUbya11owingomissionorsizereductionofthesurgeabsorberinthepowercircuit.Thisa1ternator1imitsthepositivepo1aritysurgewhenthebatteryisdisconnected.(9) Testvo1tages:UAandUBInthisstandard,thet

10、estvo1tages,UAandUb,sha11conformtotheva1uesspecifiedinTab1e1.Tab1e1TestVo1tages(Unit:V)Testvo1tage12Vparts24VpartsUa13.50.5271Ub120.2240.43. TestItemsThetestitemsandtheirapp1icationsha11conformtoTab1e2.Thedevicestobetestedsha11bethoseforvehic1esthatsha11besubjecttoEMCcertificationUN-R010andindividua

11、1deyicesthataresupp1iedtotheregionswhereEMCcertificationisrequired.Tab1e2TestItemsandTheirApp1icationTestitemAutomotivee1ectronicdevice1nAutomotivee1ectricdeviceVo1tagetransientemissiontestoTransientimmunitytestTest1QW-Test2-1OTest2-2Test3-1Test3-2Test4Test5-1Test5-2E1ectrica1transienttransmissionby

12、capacitiveandinductivecoup1ing41Notes:(1) Fordeviceshavingthecharacteristicsofbothautomotivee1ectronicande1ectricdevices,testsspecifiedforbothtypesofdevicessha11beapp1ied.(2) MaybeomittedwhenthetestspecifiedinSection6.2.1,TSC0502Giscarriedout.(3) MaybeomittedwhenthetestspecifiedinSection6.2.3,TSC050

13、2Giscarriedout.Test5-2sha11app1ytopartstobecombinedwithoni1ya1ternatorscomposedofaZenerdiode.Test5-1sha11app1ytotheotherparts.(4) MaybeomittedwhenthetestspecifiedinSection6.3.1,TSC0502Giscarriedout.Remark:O:essentia1.:arbitrary,-:inapp1icab1e4. TestAmbience.Un1essspecifiedspecifica11y,testssha11beca

14、rriedoutinthestandardambience.5. TestMethods5.1 Vo1tageTransientEmissionTest5.1.1 ObjectiveTheobjectiveofthistestistospecifythemethodformeasuringe1ectrica1disturbancesgeneratedbyautomotivee1ectricdevicesandemittedfromwireharnesses.5.1.2 TestAmbienceThetestsha11becarriedoutinthestandardambience.Recor

15、dthetemperatureduringthetest.5.1.3 TestEquipmentThetestequipmentsha11conformtoFigs.1and2.Fig.1E1ectrica1DisturbancesMeasurementSystem(forS1owPu1se)(Unit:mm)Remarks:1. Thetestequipmentsha11be1ocatedinap1acebeingfreefrome1ectromagneticinterference.2. TheDUTandwireharnesssha11be1ocatedatpositions50mm+10/-0mmabovethegroundp1ane.Ifthe1engthoftheconductorofANorswitchforcarryingtheDUToperatingcurrentis1essthan50mmfromthegroundp1ane,at1owaminimumc1earanceof50mmbetweentheANorswitchandthegroundp1ane:3. Recordanoverviewofthetestequipmentusedandtheactua1va1uesofthedimensionsspecifiedinFig